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X-ray spectrometry in electron beam instruments

X-ray spectrometry in electron beam instruments edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury - New York Plenum Press c1995 - xviii, 372 p. : ill. ; 26 cm

Includes bibliographical references and index

ISBN: 9780306448584

ISSN: 94045877

Subjects--Topical Terms:
Electron beams - Instruments
Electron probe microanalysis
X-ray spectroscopy

Dewey Class. No.: 543.08586 WIL

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X-ray spectrometry in electron beam instruments

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