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Process control and inspection for industry : 8-10 November 2000, Beijing, China

Process control and inspection for industry : 8-10 November 2000, Beijing, China Shulian Zhang, Wei Gao, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering - Bellingham, WA SPIE 2000 - xx, 434 p. : ill. ; 28 cm

Includes bibliographical references and index

ISBN: 9780819438935

ISSN: 2001269021

Subjects--Topical Terms:
Detectors - Industrial applications - Congresses
Manufacturing processes - Automation - Congresses
Process control - Automation - Congresses

Dewey Class. No.: 670.425 BEN

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Process control and inspection for industry : 8-10 November 2000, Beijing, China

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