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Optical pattern recognition XX : 16-17 April 2009, Orlando, Florida, United States

Optical pattern recognition XX : 16-17 April 2009, Orlando, Florida, United States David P. Casasent, Tien-Hsin Chao, editors ; sponsored and published by SPIE - Bellingham, WA SPIE 2009 - 1 v. (various pagings) : ill. ; 28 cm.

Includes bibliographical references and author index

ISBN: 9780819476067

ISSN: 2010287424

Subjects--Topical Terms:
Optical pattern recognition - Congresses

Dewey Class. No.: 006.42 CAS

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Optical pattern recognition XX : 16-17 April 2009, Orlando, Florida, United States

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