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Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany

Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany Wolfgang Osten, Christophe Gorecki, Erik Novak, editors ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e. V. (Germany) - Bellingham, WA SPIE c2007 - 2 v. (various pagings) : ill. ; 28 cm.

Includes bibliographical references and author index

ISBN: 9780819467584

Subjects--Topical Terms:
Optical detectors - Industrial applications - Congresses
Optical instruments - Industrial applications - Congresses
Quality control - Optical methods - Congresses

Dewey Class. No.: 670.425 OST

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Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany

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