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Optical constants of materials for UV to x-ray wavelengths : 4-5 August, 2004, Denver, Colorado, USA

Optical constants of materials for UV to x-ray wavelengths : 4-5 August, 2004, Denver, Colorado, USA Regina Soufli, John F. Seely, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering - Bellingham, WA SPIE c2004 - x, 172 p. : ill. ; 28 cm.

This conference was part of the program on X-Ray Systems and Technologies at SPIE's 49th Annual Meeting in Denver, Colorado. Includes bibliographical references and author index

ISBN: 9780819454768

ISSN: 2005298511

Subjects--Topical Terms:
Optical constants - Congresses
Refractive index - Measurement - Technique - Congresses
Thin films - Optical properties - Congresses

Dewey Class. No.: 530.4175 SOU

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Optical constants of materials for UV to x-ray wavelengths : 4-5 August, 2004, Denver, Colorado, USA

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