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Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors

Suezawa, Masashi

Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors Masashi Suezawa, Hiroshi Katayama-Yoshida - Switzerland Trans Tech Publications 1992 - 1107 p. : ill. ; 24 cm

Includes bibliographies and indexes

ISBN: 878497137

Subjects--Topical Terms:
Semiconductors - Defects - Congresses

Dewey Class. No.: 621.38152 SUE

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Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors

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