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Non-intrusive inspection technologies : 17-18 April, 2006, Kissimmee, Florida, USA

Non-intrusive inspection technologies : 17-18 April, 2006, Kissimmee, Florida, USA George Vourvopoulos, F. Patrick Doty, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering - Bellingham, WA SPIE c2006 - 1 v. (various pagings) : ill. ; 28 cm

Includes bibliographical references and author index

ISBN: 9780819462695

ISSN: 2006285160

Subjects--Topical Terms:
Freight and freightage - Inspection - Congresses
Freight and freightage - Security measures - Congresses
Optical detectors - Congresses

Dewey Class. No.: 388 VOU

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Non-intrusive inspection technologies : 17-18 April, 2006, Kissimmee, Florida, USA

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