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Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA

Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA Alexander A. Balandin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering - Bellingham, WA SPIE c2005 - xxvi, 312 p. : ill. ; 28 cm

Includes bibliographical references and author index

ISBN: 9780819458391

ISSN: 2006272391

Subjects--Topical Terms:
Electric circuits - Noise - Congresses
Electric noise - Congresses
Electronic circuits - Noise - Congresses
Electronic noise - Congresses

Dewey Class. No.: 621.38224 BAL

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Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA

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