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Noise in complex systems and stochastic dynamics : 2-4 June 2003, Santa Fe, new Mexico, USA

Noise in complex systems and stochastic dynamics : 2-4 June 2003, Santa Fe, new Mexico, USA Lutz Schimansky-Geier ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering - Bellingham, WA SPIE c2003 - xxi, 534 p. : ill. ; 28 cm

Includes bibliographical references and index

ISBN: 9780819449740

ISSN: 2004269008

Subjects--Topical Terms:
Electronic noise - Congresses
Nonlinear systems - Noise - Congresses
Stochastic processes. - Congresses
System analysis. - Congresses

Dewey Class. No.: 621.38224 SCH

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Noise in complex systems and stochastic dynamics : 2-4 June 2003, Santa Fe, new Mexico, USA

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