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Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California

Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California Geoffrey T. Burnham ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering - Bellingham, WA SPIE 2000 - viii, 320 p. : ill. ; 28 cm

Includes bibliographical references and index

ISBN: 9780819435620

ISSN: 710838

Subjects--Topical Terms:
Diodes, Semiconductor - Congresses
Semiconductor lasers - Congresses
Semiconductor lasers - Industrial applications - Congresses

Dewey Class. No.: 621.366 BUR

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Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California

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