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Journey to data quality

Lee, Yang W

Journey to data quality Yang W. Lee ... [et al.] - Cambridge, MA MIT Press 2006 - xii, 226 p. : ill. ; 24 cm

Includes bibliographical references (p. [215]-221) and index

ISBN: 9780262122870

ISSN: 2006043331

Subjects--Topical Terms:
Business - Data processing - Management
Database management - Quality control

Dewey Class. No.: 658.4038 LEE

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