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Impact of electron and scanning probe microscopy on materials research

Impact of electron and scanning probe microscopy on materials research edited by David G. Rickerby, Giovanni, Valdrè, Ugo Valdrè - Dordrecht ; Boston Kluwer Academic Publishers 1999 - xxiv, 489 p. : ill. ; 25 cm

Includes bibliographical references and index

ISBN: 9780792359395

ISSN: 99042003

Subjects--Topical Terms:
Electron microscopy
Materials - Microscopy
Scanning probe microscopy

Dewey Class. No.: 502.825028407 RIC

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