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Gettering and defect engineering in semiconductor technology XII : Gadest 2007 : proceedings of the 12th international autumn meeting, EMFCSC, Erice, Italy, October 14-19, 2007

Gettering and defect engineering in semiconductor technology XII : Gadest 2007 : proceedings of the 12th international autumn meeting, EMFCSC, Erice, Italy, October 14-19, 2007 edited by A. Cavallini . . . [et al. ] - Zurich, Switerland Trans Tech Publications 2008 - xv, 642 p. : ill. ; 25 cm

Includes bibliographical references and index

ISBN: 9783908451433

ISSN: 2008272993

Subjects--Topical Terms:
Electrical engineering - Materials - Congresses
Getters - Congresses
Semiconductors - Congresses
Silicon crystals - Defects - Congresses

Dewey Class. No.: 621.38152 CAV

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Gettering and defect engineering in semiconductor technology XII : Gadest 2007 : proceedings of the 12th international autumn meeting, EMFCSC, Erice, Italy, October 14-19, 2007

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