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Gettering and defect engineering in semiconductor technology XI : GADEST 2005 : proceedings of the 11th international autumn meeting : Giens, France, September 25-30, 2005

Gettering and defect engineering in semiconductor technology XI : GADEST 2005 : proceedings of the 11th international autumn meeting : Giens, France, September 25-30, 2005 edited by B. Pichaud . . . [et al. ] - Zurich, Switerland Trans Tech Publications 2005 - xvi, 814 p. : ill. ; 25 cm

Includes bibliographical references and index

ISBN: 9783908451136

ISSN: 2006276632

Subjects--Topical Terms:
Getters - Congresses
Semiconductors - Defects - Congresses
Semiconductors - Materials - Congresses
Silicon crystals - Congresses

Dewey Class. No.: 621.38152 PIC

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Gettering and defect engineering in semiconductor technology XI : GADEST 2005 : proceedings of the 11th international autumn meeting : Giens, France, September 25-30, 2005

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