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From contamination to defects, faults, and yield loss : simulation and applications

Khare, Jitendra B

From contamination to defects, faults, and yield loss : simulation and applications by Jitendra B. Khare, Wojciech Maly - Dordrecht ; Boston Kluwer Academic Publishers c1996 - 150 p. : ill. ; 24 cm

Includes bibliographical references and index

ISBN: 9780792397144

ISSN: 96005441

Subjects--Topical Terms:
Computer-aided design
Integrated circuits - Very large scale integration - Computer simulation
Integrated circuits - Very large scale integration - Defects
Integrated circuits - Very large scale integration - Testing

Dewey Class. No.: 621.381520685 KHA

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From contamination to defects, faults, and yield loss : simulation and applications

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