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Multi-chip module test strategies

Multi-chip module test strategies edited by Yervant Zorian - Deventer, The Netherlands ; Boston, MA Kluwer 1997 - 166 p. : ill. ; 27 cm

Includes bibliographical references and index

ISBN: 9780792399209

ISSN: 97008206

Subjects--Topical Terms:
Multichip modules (Microelectronics) - Testing

Dewey Class. No.: 621.381046 ZOR

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