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Electron microscopy and analysis

Goodhew, Peter J

Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland - 3rd ed - New York Taylor & Francis 2001 - x, 251 p. : ill. ; 24 cm

Includes bibliographical references (p. [236]-237) and index

ISBN: 9780748409686

ISSN: 37716

Subjects--Topical Terms:
Electron microscopy

Dewey Class. No.: 502.825 GOO

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Electron microscopy and analysis

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