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Delay fault testing for VLSI circuits

Krstić, Angela

Delay fault testing for VLSI circuits Angela Krstić, Kwang-Ting (Tim) Cheng - Dordrecht ; Boston Kluwer Academic Publishers 1998 - xii, 191 p. : ill. ; 24 cm

Includes bibliographical references (p. [173]-188) and index

ISBN: 9780792382959

ISSN: 98039137

Subjects--Topical Terms:
Delay faults (Semiconductors)
Integrated circuits - Very large scale integration - Testing

Dewey Class. No.: 621.381548 KRS

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Delay fault testing for VLSI circuits

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