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Defects in SiO₂ and related dielectrics : science and technology

Defects in SiO₂ and related dielectrics : science and technology edited by G. Pacchioni, L. Skuja and D.L. Griscom - Boston, MA Kluwer Academic Publishers 2000 - viii, 624 p. : ill. ; 24 cm

Includes bibliographical references and index

ISBN: 9780792366850

ISSN: 48787

Dewey Class. No.: 548.85 PAC

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Defects in SiO₂ and related dielectrics : science and technology

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