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Defect-oriented testing for Nano - Metric CMOS VLSI circuits

Sachdev, Manoj

Defect-oriented testing for Nano - Metric CMOS VLSI circuits Manoj Sachdev and Jose Pineda de Gyvez - Berlin Springer 2010 - xx, 328p. : ill

Includes index

ISBN: 9788184894295

Subjects--Topical Terms:
VLSI

Dewey Class. No.: 621.395 SAC

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Defect-oriented testing for Nano - Metric CMOS VLSI circuits

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