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CTL for test information of digital ICs

Kapur, Rohit

CTL for test information of digital ICs by Rohit Kapur - Boston Kluwer Academic Publishers 2003 - ix, 173 p. : ill. ; 24 cm.

ISBN: 9781402072932

ISSN: 2002034094

Subjects--Topical Terms:
Computer hardware description languages
Digital integrated circuits - Testing - Standards

Dewey Class. No.: 621.381548 KAP

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