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Boundary-scan interconnect diagnosis

Cheung, Peter Y. K

Boundary-scan interconnect diagnosis Jose T. de Sousa and Peter Y.K. Cheung - Boston Kluwer Academic Publishers 2001 - xxi, 168 p. : ill. ; 25 cm.

Includes bibliographical references and index

ISBN: 9780792373148

ISSN: 2001023211

Subjects--Topical Terms:
Boundary scan testing
Electric contacts - Testing
Electronic apparatus and appliances - Testing
Electronic packaging

Dewey Class. No.: 621.381 SOU

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Boundary-scan interconnect diagnosis

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