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Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000

Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 editors: Hajime Tomokage and Takashi Sekiguchi - Uetikon-Zuerich, Switzerland Scitec Publications 2001 - xiii, 441 p. : ill. ; 25 cm

Includes bibliographical references and index

ISBN: 9783908450610

ISSN: 2001277780

Subjects--Topical Terms:
Semiconductors - Defects - Congresses
Semiconductors - Microscopy - Congresses
Semiconductors - Testing - Congresses

Dewey Class. No.: 621.38152 TOM

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Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000

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