IoT System testing An IoT Journey from Devices to Analysis and the Edge /Jon Duncan Hagar

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Language: English Publication details: Apress 2023 New YorkEdition: reprintDescription: 326 p. ill.; 25 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Reference	Anna Centenary Library 3RD FLOOR, A WING	004.6 HAG (Browse shelf(Opens below))	Not for loan	667536
English Books	Anna Centenary Library 3RD FLOOR, A WING	006.7 HAG;1 (Browse shelf(Opens below))	Available	667537

Reprint 2023

Includes index

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